Abstract: Presently, the market not only requires the fault free parts but also requires delivered product to work safely and failure free i.e. reliably. So for prevention of failure of product in between manufacturing stage to final usage stage, we need to do reliability as well as performance testing.Development in the electronic system i.e. VLSI and embedded system using component like FPGA, CPLD increases the reliability issue. So for reducing the reliability issue required to understand root causes of failure which causes failure in the field and further their minimization. Some traditional approaches like MIL-217 are used for reliability prediction but these type of approaches having some limitations like, it does not consider the load profiles, no provisions for root cause of component failure, the consideration of base failure rate and other unclear modifying factors.Prognostics and health management approach (PHM) consider the life cycle loading of the electronic system with its actual working conditions, which is the better tool for reliability predictions. This approach mainly relies on extensively Highly Accelerated Life Testing (HALT). This paper gives an idea about the reliability prediction approach.

Keywords: Failure Rate,MTBF(Mean Time Between Failure),MTTF(Mean Time To Failure) FMMEA (Failure Mode Mechanism Effect Analysis),RPN (Risk Priority Number), Accelerated life Testing, Stress Models.